Open · 開放University · 大學TenderCUHK CUPro Guest
An Integrated System of Plasma Focused-Ion-Beam (PFIB) – Field Emission (FE) Scanning Electron Microscope (SEM)
Ref: T-20260315
- Published
- 2026-07-20
- Closing
- 2026-08-06
- Budget
- —
- Source type
- University · 大學
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